Ion beam processing of DNA origami nanostructures

• Leo Sala,
• Agnes Zerolová,
• Violaine Vizcaino,
• Alain Mery,
• Alicja Domaracka,
• Hermann Rothard,
• Philippe Boduch,
• Dominik Pinkas and
• Jaroslav Kocišek

Beilstein J. Nanotechnol. 2024, 15, 207–214, doi:10.3762/bjnano.15.20

• was set to 2.5 × 108 ions·cm−2·s−1. The ion flux was deduced from the measurement of the beam intensity using a detector based on secondary electron emission from a thin Fe foil placed inside the IRABAT vacuum chamber which allows for online monitoring during the irradiation of the samples. This

Sputtering onto liquids: a critical review

• Anastasiya Sergievskaya,
• Adrien Chauvin and
• Stephanos Konstantinidis

Beilstein J. Nanotechnol. 2022, 13, 10–53, doi:10.3762/bjnano.13.2

• ]. Also, the ion-induced secondary electron emission yield (ISEE) of the target in its metallic and poisoned states are different. So-called secondary electrons are electrons emitted by the surface when the latter is bombarded by fast particles such as ions. If more (or less) secondary electrons enter the

Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?

• Annalena Wolff

Beilstein J. Nanotechnol. 2021, 12, 965–983, doi:10.3762/bjnano.12.73

• interaction types is illustrated in Figure 1. The ions, irrespective of the ion species, interact with the sample atoms via nuclear and electronic interactions. The electronic interactions lead to secondary electron emission and polymerization while the nuclear interactions lead to sputtering, sample atom

A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

• Frances I. Allen

Beilstein J. Nanotechnol. 2021, 12, 633–664, doi:10.3762/bjnano.12.52

• resists, including a fullerene-based molecular resist [121], a tetracene molecular resist [122], and various organic–inorganic resists [123][124][125][126][127][128][129]. The enhanced sensitivity of resists to helium ions has been attributed to the higher secondary electron emission yield and the fact

Identification of physicochemical properties that modulate nanoparticle aggregation in blood

• Ludovica Soddu,
• Duong N. Trinh,
• Eimear Dunne,
• Dermot Kenny,
• Giorgia Bernardini,
• Ida Kokalari,
• Arianna Marucco,
• Marco P. Monopoli and
• Ivana Fenoglio

Beilstein J. Nanotechnol. 2020, 11, 550–567, doi:10.3762/bjnano.11.44

• at room temperature. In the case of SNPs, the samples were sputter-coated with a thick gold film (≈17 nm) under argon atmosphere to improve secondary electron emission during SEM imaging. The NPs morphology was observed at an acceleration voltage of 20 kV. Dynamic light scattering (DLS) The mean

Magnetic characterization of cobalt nanowires and square nanorings fabricated by focused electron beam induced deposition

• Federico Venturi,
• Gian Carlo Gazzadi,
• Amir H. Tavabi,
• Alberto Rota,
• Rafal E. Dunin-Borkowski and
• Stefano Frabboni

Beilstein J. Nanotechnol. 2018, 9, 1040–1049, doi:10.3762/bjnano.9.97

• focused electron beam induced deposition (FEBID) of Co carbonyl (Co2(CO)8). This is a direct-write technique performed in a scanning electron microscope (SEM) equipped with a gas injector system (GIS) [9]. It exploits secondary electron emission resulting from interaction of the primary electron beam with

Amplified cross-linking efficiency of self-assembled monolayers through targeted dissociative electron attachment for the production of carbon nanomembranes

• Sascha Koch,
• Christopher D. Kaiser,
• Paul Penner,
• Michael Barclay,
• Lena Frommeyer,
• Daniel Emmrich,
• Patrick Stohmann,
• Tarek Abu-Husein,
• Andreas Terfort,
• D. Howard Fairbrother,
• Oddur Ingólfsson and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2017, 8, 2562–2571, doi:10.3762/bjnano.8.256

• forming SAMs and is also likely to affect the cross-linking efficiency [40]. Secondly, when a SAM is formed on a metallic surface, such as Au(111) for example, the work function of the substrate is changed, leading to an increase or a decrease of the secondary electron emission. In the same manner, self

Electron beam induced deposition of silacyclohexane and dichlorosilacyclohexane: the role of dissociative ionization and dissociative electron attachment in the deposition process

• Ragesh Kumar T P,
• Sangeetha Hari,
• Krishna K Damodaran,
• Oddur Ingólfsson and
• Cornelis W. Hagen

Beilstein J. Nanotechnol. 2017, 8, 2376–2388, doi:10.3762/bjnano.8.237

• electrons within the respective energy ranges. From the secondary electron emission spectra of Si irradiated at 1 keV [47], the integrated contribution of emitted electrons with energies below 2 eV and in the energy range from 6 to 9 eV can be estimated to be close to 50% of the total emitted SEs below 20

Fundamental properties of high-quality carbon nanofoam: from low to high density

• Natalie Frese,
• Shelby Taylor Mitchell,
• Christof Neumann,
• Amanda Bowers,
• Armin Gölzhäuser and
• Klaus Sattler

Beilstein J. Nanotechnol. 2016, 7, 2065–2073, doi:10.3762/bjnano.7.197

• under investigation using an electro-optical lens system. The image is then provided either by ionoluminescence [26], Rutherford backscattering of the ions [27], or secondary electron emission [28]. The high resolution is given by the small subsurface ion beam spread [29]. The instrument is suitable for

• the imaging of low-mass elements such as carbon due to its very high brightness. In addition to imaging, elemental analysis can be achieved with the He-ion microscope [30]. In this work we chose to use the secondary electron emission setup for imaging of our samples. Raman spectroscopy Raman

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

• Urs Gysin,
• Thilo Glatzel,
• Thomas Schmölzer,
• Adolf Schöner,
• Sergey Reshanov,
• Holger Bartolf and
• Ernst Meyer

Beilstein J. Nanotechnol. 2015, 6, 2485–2497, doi:10.3762/bjnano.6.258

• Wtheo = 570 nm that is analytically calculated through Equation 1 and Equation 3 [57]. A much longer decay of the surface potential was also observed by M. Gao et al. in locally resolved secondary electron emission measurements across a SiC p/n-junction [44]. They attributed the increase of the SCR to

Self-organization of gold nanoparticles on silanated surfaces

• Htet H. Kyaw,
• Salim H. Al-Harthi,
• Azzouz Sellai and
• Joydeep Dutta

Beilstein J. Nanotechnol. 2015, 6, 2345–2353, doi:10.3762/bjnano.6.242

• broader (see Figure 6a). The features observed at ca. 16 eV can be assigned as the background of the secondary electron emissions from the surfaces of AuNPs. The changes in the intensity of secondary electron emission due to the different surface morphologies of AuNPs on APTES-functionalized glass

• electron emission after APTES was deposited on the glass substrate and AuNPs were deposited on the APTES-functionalized glass substrate. The work function (Φ) can be calculated from the difference in the photon energy of He(I) (21.2 eV) and the energy difference ΔE between the secondary cut-off energy

• eV [24] could not be observed due to the interference from the glass substrate. The features observed at ca. 16 eV are due to the background of secondary electron emissions which arise from the substrates near-surface region. An enhancement in the spectral intensity is observed at the secondary

Surface excitations in the modelling of electron transport for electron-beam-induced deposition experiments

• Francesc Salvat-Pujol,
• Roser Valentí and
• Wolfgang S. Werner

Beilstein J. Nanotechnol. 2015, 6, 1260–1267, doi:10.3762/bjnano.6.129

• of electron transport; surface excitations; secondary-electron emission; Introduction An accurate modelling of the energy losses of electrons traversing a solid surface is instrumental for a quantitative understanding of a series of techniques exploiting transmitted, reflected, or emitted electrons

• , the inclusion of surface excitations in the modelling of electron-transport is expected to give a yet more quantitative description of FEBID processes at and below the 1 keV primary-energy domain. Secondary-electron emission Energy losses of the charged projectile can lead to the ejection of loosely

Fabrication of high-resolution nanostructures of complex geometry by the single-spot nanolithography method

• Alexander Samardak,
• Margarita Anisimova,
• Aleksei Samardak and
• Alexey Ognev

Beilstein J. Nanotechnol. 2015, 6, 976–986, doi:10.3762/bjnano.6.101

• of the atoms. If an electron has kinetic energy above the interaction treshold, three random scenarios are possible: small-angle forward scattering, wide-angle back scattering or secondary electron emission. Backscattered electrons are the main cause of the subsequent exposure of resist areas a few

The role of electron-stimulated desorption in focused electron beam induced deposition

• Willem F. van Dorp,
• Thomas W. Hansen,
• Jakob B. Wagner and
• Jeff T. M. De Hosson

Beilstein J. Nanotechnol. 2013, 4, 474–480, doi:10.3762/bjnano.4.56

• of secondary electron emission. According to Madey and Yates, “electron bombardment can promote the desorption of ionic and neutral atomic and molecular species from the surface, can alter the bonding of surface species and can cause polymerization” [17]. While the latter two processes are driving

• al. [16]. We contribute this discrepancy to electron-stimulated desorption, which is known to occur during electron irradiation. Electron-stimulated desorption is observed for many adsorbates and is induced by secondary electron emission. Our experimental result suggests that, of the W(CO)6 molecules